Optimal TEM specimen preparation doneFirst Time Right
- Achieve ultimate specimen quality – free from amorphous and implanted layers
- Complements FIB technology
- Milling without introduction of artifacts
- Microscope connectivity for risk-free specimen handling
- Adds capability and capacity
Focused ion beam (FIB) milling is a widely used technique for today’s cutting-edge materials that provides a means to prepare transmission electron microscopy (TEM) specimens. The challenge in working with these advanced materials is to create specimens that are electron transparent and are free from artifacts. The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both.
Let the FIB do what the FIB does best; let the PicoMill system do the rest
To maximize FIB capacity, specimens can be moved offline for final thinning on the PicoMill system. The PicoMill system provides the ability to precisely and predictably thin a specimen, which reduces the potential for rework and optimizes specimen processing time. This increases your capability by producing specimens of superior quality and enhances the overall specimen preparation throughput.
The PicoMill system will allow you to achievefirst time rightspecimen preparation every time.
Site-specific, ultra-low-energy milling
The ion beam impingement angle is programmable from -15° to +90°. The ion source is fixed in position and the goniometer tilts the specimen holder to achieve the programmed milling angle through the PicoMill system user interface. The specimen is positioned along the X, Y, and Z axes to precisely orient the FIB lamella with respect to the ion and electron beams.
In situ imaging
To complement the scanning electron column, the PicoMill system has multiple detectors:
Abackscatter electron detector(BSE) for in situ imaging with electrons
Asecondary electron detector（SED）用于与离子和电子的原位成像
Ascanning/transmission electron detector（Stew）用于电子透明度和终点检测
The detector combination allows you to perform in situ imaging of the specimen before, during, and after ion milling. The grid containing a FIB lamella or a specific site on a conventionally prepared specimen can be imaged.
You can view specimens in situ on a dedicated monitor that displays both electron- and ion-induced secondary electron images. Image capture is as simple as a click of a mouse.
A specimen prepared with optimal electron transparency is the ultimate goal for the best quality TEM imaging and analysis. This is particularly key when employing today’s aberration-corrected TEM technology.
As the specimen thins, electron transmission increases and the leading edge recedes, which allows the STEM detector to provide end point information. The PicoMill system is also capable of time-based termination or it can be stopped manually.
PicoMill is a registered trademark of E.A. Fischione Instruments, Inc. PicoMilling is a service mark of E.A. Fischione Instruments, Inc.