型号1080.

Picomill®Tem样本制备系统

Optimal TEM specimen preparation doneFirst Time Right

  • Achieve ultimate specimen quality – free from amorphous and implanted layers
  • Complements FIB technology
  • Milling without introduction of artifacts
  • 用于成像和精确端点检测的高级探测器技术
  • 用离子和电子成像
  • Microscope connectivity for risk-free specimen handling
  • Adds capability and capacity
  • 快速,可靠且易于使用

后网后处理产生最高质量的TEM标本

Focused ion beam (FIB) milling is a widely used technique for today’s cutting-edge materials that provides a means to prepare transmission electron microscopy (TEM) specimens. The challenge in working with these advanced materials is to create specimens that are electron transparent and are free from artifacts. The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both.

Picomill系统是对FIB技术的理想补充;它增加了产生最佳样品质量的增加能力,同时通过移动最终稀疏的离线来提高整体样本制备吞吐量。

Let the FIB do what the FIB does best; let the PicoMill system do the rest

To maximize FIB capacity, specimens can be moved offline for final thinning on the PicoMill system. The PicoMill system provides the ability to precisely and predictably thin a specimen, which reduces the potential for rework and optimizes specimen processing time. This increases your capability by producing specimens of superior quality and enhances the overall specimen preparation throughput.

The PicoMill system will allow you to achievefirst time rightspecimen preparation every time.

Site-specific, ultra-low-energy milling

Picomill系统的离子源具有基于丝的电离室和静电镜片。专门开发离子源以产生具有亚微米离子束直径的超低离子能量。它使用惰性气体(氩气),其工作电压范围为50eV至2kV。

离子源的反馈控制算法在各种铣削参数上自动产生稳定和可重复的离子束条件。避免了溅射材料在感兴趣区域上,因为离子束可以集中在特定区域。您可以扫描样本表面的区域或针对选择性铣削的特定区域。离子只联系了他们需要进行工作所需的标本的兴趣点。离子束远离网格,这防止了雷蚀。

精密铣削角广告justment

The ion beam impingement angle is programmable from -15° to +90°. The ion source is fixed in position and the goniometer tilts the specimen holder to achieve the programmed milling angle through the PicoMill system user interface. The specimen is positioned along the X, Y, and Z axes to precisely orient the FIB lamella with respect to the ion and electron beams.

铣削标本低发生率(少于10°),最大限度地减少损坏和标本加热。由于低角度铣削,结合离子束光栅化,便于不同材料的均匀稀释,所以在制备层状结构或复合材料时,它是非常有益的。

In situ imaging

To complement the scanning electron column, the PicoMill system has multiple detectors:

  • Abackscatter electron detector(BSE) for in situ imaging with electrons

  • Asecondary electron detector(SED)用于与离子和电子的原位成像

  • Ascanning/transmission electron detector(Stew)用于电子透明度和终点检测

The detector combination allows you to perform in situ imaging of the specimen before, during, and after ion milling. The grid containing a FIB lamella or a specific site on a conventionally prepared specimen can be imaged.

You can view specimens in situ on a dedicated monitor that displays both electron- and ion-induced secondary electron images. Image capture is as simple as a click of a mouse.

终点检测/过程终止

A specimen prepared with optimal electron transparency is the ultimate goal for the best quality TEM imaging and analysis. This is particularly key when employing today’s aberration-corrected TEM technology.

As the specimen thins, electron transmission increases and the leading edge recedes, which allows the STEM detector to provide end point information. The PicoMill system is also capable of time-based termination or it can be stopped manually.

显微镜连接可减少样品处理

在Picomill系统中使用相同的持有者的能力和TEM意味着您可以快速安全地将碾碎的样本从Picomill系统运送到TEM,这在使用单一样本时特别有利。

PicoMill is a registered trademark of E.A. Fischione Instruments, Inc. PicoMilling is a service mark of E.A. Fischione Instruments, Inc.